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Cascade Microtech Summit 12000 Semi-automatic Wafer Prober
Cascade Microtech Summit 12000 Semi-automatic Wafer Prober


 
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Product Code: 10297
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Description
 

The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements.

EQUIPMENT CONFIGURATION & SPECIFICATIONS

Probe Station: Cascade Microtech Summit 12000-series semi-automatic wafer probe station

RF/Microwave Wave Chuck: 6-inch/150mm wafer chuck (Ni)

System Controller: 19-inch rack-mount computer; Windows 10 Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software.

Microscope: Mitutoyo FS-50 compound microscope,
Eyepiece Lenses: WF 10X eyepieces
Objective Lenses: Mitutoyo MPlan APO 2X and
MPlan APO 10X objective lenses (qty 1 each). Additional microscope lenses are sold separately.

Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift


OPTIONAL ACCESSORIES
(sold separately, please inquire about availability)

  • Probe Positioners: We have a limited supply of RF and DC probe positioners in stock, please call for details.
  • Additional Microscope Objective Lenses: Please inquire about additional objective lens magnifications in stock
  • Vibration Isolation Table: Vib-Iso table as shown in photos is an optional accessory that is sold separately and subject to availability at the time of order. We have several different models in stock, please inquire.

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