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You are here:Home > Wafer Probe & Inspection Equipment Choose a sub category: Microscopes Wafer Probers Sort By: Price: Low to High Price: High to Low Most Popular Title Manufacturer Newest Oldest Availability 20 per page 40 per page 80 per page 120 per page 200 per page Page of 1 Agilent Technologies 34401A 6.5 Digit Multimeter Our Price: $600.00 Request A Quote Cascade Microtech® Summit 12000 Semi-Automatic Wafer Prober Request A Quote Agilent 34401A DMM The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech® Summit 12000 Semi-Automatic Wafer Probe Station Request A Quote Cascade Microtech Summit 11000 Manual Wafer Prober Request A Quote The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements... Cascade Microtech Summit 9000 Manual Wafer Prober Request A Quote Cascade Microtech Summit 12000 Semi-automatic Wafer Prober Request A Quote Cascade Microtech 9000-series probe system uses a flexible modular design to accommodate the full range of Cascade's microwave and digital micro probing tools. It is specifically designed for high-frequency device and circuit characterization, and high-speed interconnect package, and device testing... Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Keysight Technologies / HP 04155-61602 Kelvin Trialxial Cable Our Price: $250.00 Request A Quote Hewlett Packard 3478A Digital Multimeter Our Price: $275.00 Request A Quote Keysight Technologies / Hewlett Packard 04155-61602 Kelvin Trialxial Cable (3m) HP 3478A DMM Signatone S-251-6 Manual Wafer Probe Station Our Price: $7,500.00 Request A Quote Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM) Request A Quote Signatone S-251-6 Probe Station The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc... Micromanipulator S8 Desktop Prober Request A Quote Nikon Optiphot 200 Wafer Inspection Microscope Request A Quote Real estate in today's failure analysis labs comes at a premium price. With the amount of equipment that is required to support testing processes, smaller equipment with acceptable usability is often required. Because of its compact footprint, the Micromanipulator Model S8 is the ideal prober where lab space may be limited... The Nikon Optiphot 200 IC Wafer Inspection Microscope features ergonomic design, rigid construction and a CF Infinity optical system... SUSS MicroTec® PM8 Probe Station Request A Quote The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...