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Agilent 34401A DMM Cascade Microtech Summit 12000 Semi-Automatic Wafer Prober
Agilent 34401A DMM
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...
Cascade Microtech Summit 12000 Semi-Automatic Wafer Prober Cascade Microtech Summit 11000 Manual Wafer Prober
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements...
Cascade Microtech Summit 9000 Manual Wafer Prober Cascade Microtech Summit 12000 Semi-Automatic Wafer Prober
Cascade Microtech 9000-series probe system uses a flexible modular design to accommodate the full range of Cascade's microwave and digital micro probing tools. It is specifically designed for high-frequency device and circuit characterization, and high-speed interconnect package, and device testing... The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...
HP 04155-61602 Triax Cable HP 3478A DMM
Keysight Technologies / Hewlett Packard 04155-61602 Kelvin Trialxial Cable (3m) HP 3478A DMM
Signatone S-251-6 Wafer Probe Station Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM)
Signatone S-251-6 Probe Station
The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc...
Micromanipulator S8 Desktop Prober Nikon Optiphot 200
Real estate in today's failure analysis labs comes at a premium price. With the amount of equipment that is required to support testing processes, smaller equipment with acceptable usability is often required. Because of its compact footprint, the Micromanipulator Model S8 is the ideal prober where lab space may be limited...
The Nikon Optiphot 200 IC Wafer Inspection Microscope features ergonomic design, rigid construction and a CF Infinity optical system...