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You are here:Home > Wafer Probe & Inspection Equipment Choose a sub category: Microscopes Wafer Probers Sort By: Price: Low to High Price: High to Low Most Popular Title Manufacturer Newest Oldest Availability 20 per page 40 per page 80 per page 120 per page 200 per page Page of 1 Agilent Technologies 34401A 6.5 Digit Multimeter Our Price: $795.00 Request A Quote Cascade Microtech® Summit 12000 Semi-Automatic Wafer Prober Request A Quote Agilent 34401A DMM The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech® Summit 12000 Semi-Automatic Wafer Probe Station Request A Quote Cascade Microtech Summit 11000 Manual Wafer Prober Request A Quote The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements... Cascade Microtech Summit 9000 Manual Wafer Prober Request A Quote Cascade Microtech® Summit 12000 Semi-Automatic Wafer Probe Station Request A Quote Cascade Microtech 9000-series probe system uses a flexible modular design to accommodate the full range of Cascade's microwave and digital micro probing tools. It is specifically designed for high-frequency device and circuit characterization, and high-speed interconnect package, and device testing... The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Cascade Microtech® Summit 12000 Semi-Automatic Wafer Probe Station Request A Quote Keysight Technologies / HP 04155-61602 Kelvin Trialxial Cable Our Price: $300.00 Request A Quote The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements... Keysight Technologies / Hewlett Packard 04155-61602 Kelvin Trialxial Cable (3m) Hewlett Packard 3478A Digital Multimeter Our Price: $295.00 Request A Quote Signatone S-251-6 Manual Wafer Probe Station Our Price: $8,250.00 Request A Quote HP 3478A DMM Signatone S-251-6 Probe Station Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM) Request A Quote Nikon Optiphot 200 Wafer Inspection Microscope Request A Quote The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc... The Nikon Optiphot 200 IC Wafer Inspection Microscope features ergonomic design, rigid construction and a CF Infinity optical system... SUSS MicroTec® PM8 Probe Station Request A Quote The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...