Refurbished Semiconductor Manufacturing Equipment, Research & Development Equipment, Laboratory and Test Equipment

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Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM)
The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection is ideal for observing complete wafers to identify problems such as stacking-faults, deep holes, etc...