Description
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements.
EQUIPMENT CONFIGURATION & SPECIFICATIONS
Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM)
Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni)
System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software.
Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately.
Large Area Bridge Mount:
6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis
travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift
OPTIONAL ACCESSORIES (sold separately, please inquire about availability)