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Agilent 34401A DMM
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The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...
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Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements...
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The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...
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The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...
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The Cascade Microtech M150 platform is a high-performance probe station that allows for precision electrical measurements, for high-frequency RF or DC testing. The system can accommodate pieces of wafers and full wafers up to 150 mm wafers, which are held in place by a vacuum chuck. The Leica S6D stereo zoom microscope, with LED illuminator, and CCD camera allows for precise placement of the manipulator test probes using the on screen display or microscope eye piece viewing. This system is configured with the probe card holder assembly for use with industry standard 5.5 inch probe cards.
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Keysight Technologies / Hewlett Packard 04155-61602 Kelvin Trialxial Cable (3m)
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The Nikon Optiphot 200 IC Wafer Inspection Microscope features ergonomic design, rigid construction and a CF Infinity optical system...
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