Description
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements.
EQUIPMENT CONFIGURATION & SPECIFICATIONS
Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM)
Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Au) with FemtoGuard(TM) shielding
System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software.
Microscope: Compound microscope, includes 10X eyepieces and (qty 1 ea) MPlan APO 2X, 10X, and 20X objective lens. Additional microscope lenses are sold separately.
High Stability Optics Bridge Mount: 2 inch X and Y axis travel (+/- 1 inch from center), pneumatic tilt-back Z lift
OPTIONAL ACCESSORIES (sold separately, please inquire about availability)