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Cascade Microtech Summit 12000 Semi-Automatic Wafer Prober Cascade Microtech M150 Manual Wafer Probe Station
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements...

The Cascade Microtech M150 platform is a high-performance probe station that allows for precision electrical measurements, for high-frequency RF or DC testing. The system can accommodate pieces of wafers and full wafers up to 150 mm wafers, which are held in place by a vacuum chuck. The Leica S6D stereo zoom microscope, with LED illuminator, and CCD camera allows for precise placement of the manipulator test probes using the on screen display or microscope eye piece viewing. This system is configured with the probe card holder assembly for use with industry standard 5.5 inch probe cards.

UVOCS 10x10-OES
The UV-Ozone cleaning process provides a simple, inexpensive, and fast method of obtaining ultra-clean surfaces free of organic contaminants on most inorganic substances...