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Cascade Microtech Summit 11000 Manual Wafer Prober
Cascade Microtech Summit 11000 Manual Wafer Prober
 
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Product Code: 10277
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Description
 
Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements.

EQUIPMENT CONFIGURATION & SPECIFICATIONS

Probe Station: Cascade Summit 11000-series manual wafer prober

Wafer Chuck: 6-inch/150mm RF/Microwave wave chuck (Ni)

Wafer Chuck Travel: X-Y travel = 203mm x 203mm with 0.1 um resolution; Z travel = 5mm with 1 um resolution

Microscope: Optem A-Zoom2 microscope (model # 48-10-32-03); with Optem HR10x/0.54 high-resolution objective lens and Mitutoyo WF10x/24 eyepiece lenses
Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift

OPTIONAL ACCESSORIES (sold separately, please inquire about availability)
  • Additional microscope objective lenses. Please inquire about additional objective lens magnifications in stock
  • Vibration-Isolation workstation

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